Electrical & Electronic Engineering |
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A recoverable stress testing algorithm for compression and encryption cards |
Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING |
Network and Security Lab, School of Computer Science and Technology, Zhejiang University, Hangzhou 310027, China |
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Abstract This study proposes a recoverable stress testing algorithm (RSTA) for such special devices as compression/decompression card and encryption/decryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.
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Received: 17 December 2007
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