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Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering)  2008, Vol. 9 Issue (10): 1398-1405    DOI: 10.1631/jzus.A0720130
Electrical & Electronic Engineering     
A recoverable stress testing algorithm for compression and encryption cards
Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING
Network and Security Lab, School of Computer Science and Technology, Zhejiang University, Hangzhou 310027, China
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Abstract  This study proposes a recoverable stress testing algorithm (RSTA) for such special devices as compression/decompression card and encryption/decryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.

Key wordsStress testing      Random sequence      Chaos function      Synchronization      Concurrency     
Received: 17 December 2007     
CLC:  TP312  
Cite this article:

Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING. A recoverable stress testing algorithm for compression and encryption cards. Journal of Zhejiang University-SCIENCE A (Applied Physics & Engineering), 2008, 9(10): 1398-1405.

URL:

http://www.zjujournals.com/xueshu/zjus-a/10.1631/jzus.A0720130     OR     http://www.zjujournals.com/xueshu/zjus-a/Y2008/V9/I10/1398

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